Dranetz Visa Guide de l'utilisateur Page 208

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B-4
Measured Parameters
Measured Parameters
Voltage
Type: 4 full differential, DC coupled
Channels A, B, C, D Input Range: 10 - 600 Vrms
Input impedance: 16 MΩ, minimum, Input to Input
RMS Accuracy: ±0.1% of Reading, ±0.05% Full Scale, over 7KHz bandwidth
(1 second rms readings)
CMRR: -80 db typical
Current
Type: 4 full differential, DC coupled.
Channels A, B, C, D Input Range: 10 - 200% of Rated Probe Input (Dranetz-BMI
probes)
RMS Accuracy:
±0.1% of Reading ±0.05% Full Scale plus Probe Accuracy, 3KHz bandwidth (1 second
rms readings)
Phase
Each voltage/current pair (i.e. Channel A voltage, Channel A current) are sampled
simultaneously to preserve phase relationship.
Frequency
Two ranges, user selectable.
For PowerVisa:
• 30 - 70 Hz default, with up to 25% Vthd
• 15 - 30 Hz
Accuracy: ±0.2% of reading
Environmental
All specifications are met over the operating range with influence factors as per IEC
61000-4-30 Class A.
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Fluke 900 Handbücher

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Fluke 900 Bedienungsanleitung (182 Seiten)


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Inhaltsverzeichnis

FLUKE 900

1

SERVICE MANUAL

1

Table of Contents

3

5

1 Service Manual Introduction

9

Service Manual Introduction

12

FLUKE 900 SERVICE MANUAL

12

2 Theory of Operation

13

2.1 General

13

2.2 Interface Buffer

14

2.3 Micro Board

15

Theory of Operation

16

MICRD BOARD ARCHITECTURE

17

2.4 High Speed Board

18

INPUT BUFFER

19

HIGH SPEED BGARD

19

MICRO BOARD

19

2.5 Test Clips

23

3 Selftest

25

3.1 Reading Selftest Results

25

11111111

27

Seiftest

28

SLFT_CLIP

30

Selftest

31

TPQT^ Pn P1

32

Frequency HW subtest

35

Threshold HW subtest

35

Reset HW subtest

35

Result bytes:

36

KEYBOARD_OPEN

38

TEST 49

38

TEST_CYCLE

38

TEST 50

40

UART_TEST

40

TEST 51

41

DGATE_TEST

41

TEST 52

43

PULL0_XTRIG

43

TEST 53

44

PULL1_XTRIG

44

TEST 54

45

PULL_XEVENT

45

TEST 55

45

SHADJNIT

45

TEST E60

46

WALK_SIZELEDS

46

TEST E61

46

TEST_MEMORY

46

TEST E62

47

WALK_MONLEDS

47

TEST E63

47

UPDATE_VCC_LIM

47

B7 B6 B5 B4 B3 B2 B1 BO

49

BYTE 3

49

3.4 System Error Codes

51

4 Troubleshooting

53

Troubleshooting

54

TEST CLIP

58

HIGH SPEED BOARD

58

TEST CLIP : INPUT BUFFER

60

TEST CLIP :

64

• -AA/V

64

TEST CLIP INPUT BUFFER

67

L-]d «[—AAA/

71

• n - 44.10.120.1(0.200.14«

72

4.4 Failure Examples

75

4.4.1 IB Reversal

75

4.4.2 Static-blown HSB

76

00000010

76

4.4.3 Missing -5 V

77

5 Maintenance

79

5.2 Performing Adjustments

80

5.2.1 Adjustment to Vcc

80

5.3.1 Microprocessor Board

81

5.3.2 Keyboard

82

5.3.4 Display Controller

83

5.3.5 Display

83

5.3.3 Speaker

83

5.3.6 High Speed Board

84

5.3.7 Power Supply

84

5.3.7.1 Fan

84

5.3.8 Interface Buffer Board

85

5.4 Calibration Procedures

85

for all pins should be

86

Fluke P/N

89

shift should be

90

[enter)(^)

91

5.5.2 900 System Firmware

95

Maintenance

96

6 Schematics

97

6.1 INTERFACE BUFFER - IB

97

О iÛ^=i

99

ЦП'П

101

<T=>

107

1 Layout Page

113

13 Schematic Pages

113

' '

115

AÌ5IVCC Ш

123

Ai>bbhA

123

, , N\U /ЯА /Н

131

'866)

133

, HAPrWOUT

135

RN7 RN8

135

Schematics

143

FILE. CPU.CSD Dwc. SM508

147

IM 3 0 0 0

155

HIGH SPEED

155

SHRAM. CSD owe. SM508 REV. 3

155

SSSm mm mm

159

.^eSSHL

169

7 Fluke 900 Parts Lists

171

7.1 900 Final Assembly

172

Fluke 900 Parts Lists

173

7.2 A1 Interface Buffer IB

174

7.3 A2 Micro Board M2

176

7.4 A3 High Speed H3

178





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